Semiconductors are widely used in electronic devices because their conductivity can be controlled through doping, by applying an electric or magnetic field, or by exposure to light or heat.
THz characterization system, new cryogenic THz probe arm to be featured at IRMMW-THz and EuMW
Park Systems Introduces the Only AFM Capable of 300mm Wafer Scans for Defect Review and Failure Analysis in Semiconductor Manufacturing and Research
The NX20 300mm, the only AFM on the market capable of scanning the entire sample area of 300mm wafers.
Revolutionary Park System SmartScan Automatizes the Atomic Force Microscope Imaging Process–High Quality Images at Click of a Button video
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 is now shipping Park SmartScan, powerful and first of a kind AFM nanoscopic tool that drastically boosts productivity by creating point and click reliable nanoscale images.