Nanotechnology

Specialist equipment and materials for scientists working at the nanoscale. Includes material synthesis, analytical equipment, and applications.

Products

450x252

Custom solutions from Nanosurf download

Nanosurf AG 19 May 2015

Systems tailored to your needs

150512 nx hivac

Park Systems Introduces Park NX-Hivac, a High Vacuum SSRM AFM System for Optimal Results in Semiconductor Manufacturing Failure Analysis

Park Systems 15 May 2015

Our commitment to superior products that enhance the customer’s performance led to the development of NX-Hivac, which was designed in collaboration with a major semiconductor IC producer. —Keibock Lee, Park Systems President

150512 nx10 front

Park Systems Awarded the New Economy Magazine “Best Analytic Instrumentation Company 2014”

Park Systems 15 May 2015

“SmartScan fully automatizes AFM imaging making it very easy for anyone to take an image of a sample at nanoscale resolution and clarity comparable to one taken by an expert,” comments Dr. Sang-il Park, CEO and founder of Park Systems.

Crystal

Maximum Precision in 3D Printing

Nanoscribe GmbH 8 May 2015

New complete solution makes additive manufacturing standard for microfabrication

Pwmay15cover 500

Physics World May 2015

IOP Publishing 7 May 2015

Digital issue now live

Toptica femto fiber laser

Powerful femtosecond pulses at 1030 nm!

TOPTICA Photonics AG 27 Apr 2015

TOPTICA expands their portfolio of ultrafast fiber-basedlaser systems.

S11154 201 ct

New Photo IC with Near Human Eye Response

Hamamatsu Photonics 9 Apr 2015

Hamamatsu Photonics introduces a new Photo IC diode, the S11154-201CT, with spectral response characteristics designed to closely match that of the human eye.

Mc pherson ccd vuvas

New CCD-based VUV Absorbance Detector

McPherson 8 Apr 2015

New McPherson CCD-UV Absorbance Spectrophotometer extends capabilities to deep ultraviolet and at faster time scales

Pwapr15cover 500

Physics World April 2015

IOP Publishing 2 Apr 2015

Learning by doing…The power of practical science

My qa platform cube

IBA releases myQA®: New Global Quality Assurance Platform, The All-in-One, All Connected, and All Secure solution.

IBA Dosimetry 27 Mar 2015

Connecting QA applications, people, and know-how through a Central Database and the Cloud.

Services

Waveguiding and detecting structure for surface plasmon polaritons on silicon

Toyohashi University of Technology 25 Jun 2014

(Toyohashi, Japan, 25 June 2014) Toyohashi Tech researchers have developed a simple, low-loss waveguide for Surface Plasmon Polaritons (SPPs) that is applicable to nanoscale photonic integrated circuits on silicon.

Resources

450x252

Current and upcoming events

Nanosurf AG 28 May 2015

Visit us at conferences throughout 2015

101426 fum2015

4th FluidFM User Meeting

Nanosurf AG 19 May 2015

Together with ETH-LBB and Cytosurge, Nanosurf is organizing the 4th FluidFM user meeting.

Polymer blend image.jpg

Webinar announced for May 28th 2015

Oxford Instruments Asylum Research, Inc. 12 May 2015

Oxford Instruments Asylum Research along with the Materials Research Society (MRS) will host a webinar titled “Beyond Topography: New Advances in AFM Characterization of Polymers” on May 28th, 2015 at 11:00 am ET.

Nano1

Nanoparticle Workshop

British Vacuum Council 8 May 2015

We are extremely grateful for the support of the BVC whose contribution greatly aided in the success of our workshop.

Time pro screenshot b

Time Dependant Spectroscopy of Microscopic Samples

CRAIC Technologies, Inc. 7 May 2015

CRAIC TimePro™ software is used with CRAIC Technologies microspectrometers to measure the kinetic UV-visible-NIR, Raman and fluorescence spectra of microscopic sample areas.

Nanomech pro toolbox

New Application Note Describes Nanomechanical Measurements on Diverse Materials Using the Asylum Research NanomechPro Toolkit

Oxford Instruments Asylum Research, Inc. 6 May 2015

Oxford Instruments Asylum Research has released a new application note, “The NanomechPro™ Toolkit: Nanomechanical AFM Techniques for Diverse Materials,” written Dr. Donna Hurley, founder of Lark Scientific and former NIST project leader.

OWIS 35 year anniversary

OWIS® celebrates the company’s 35th anniversary

OWIS GmbH 27 Apr 2015

Staufen, 24.04.2015 ¦ The OWIS GmbH, headquartered in Staufen i. Br. in the southwest of Germany, celebrates this year its 35-year anniversary

Hayabusa2 list 001 e1417594957999

G&H acousto-optic technology launches into space on asteroid probe

Gooch & Housego 20 Apr 2015

On 3 December, the Japan Aerospace Exploration Agency (JAXA) funded Hayabusa 2 asteroid exploration mission launched on a six year mission to collect geological samples from the (162173) 1999 JU3 asteroid – an Apollo or “near earth” asteroid.

450x252

Announcement of new incubate in the STFC CERN Business Incubation Centre

The Science and Technology Facilities Council (STFC) - Business and Innovations 9 Apr 2015

Interview from Oxford nanoSystems

Pztcypherimage

Oxford Instruments Asylum Research Presents “Piezoresponse Force Microscopy: From Theory to Advanced Applications”

Oxford Instruments Asylum Research, Inc. 7 Apr 2015

Two-part Webinar Series May 4 and May 6, 2015

Featured suppliers

Master+Bond Moeller+Wedel
modus logo Oxford+Instruments+Asylum+Research%2c+Inc.