Specialist equipment and materials for scientists working at the nanoscale. Includes material synthesis, analytical equipment, and applications.
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Park Systems Introduces Park NX-Hivac, a High Vacuum SSRM AFM System for Optimal Results in Semiconductor Manufacturing Failure Analysis
Our commitment to superior products that enhance the customer’s performance led to the development of NX-Hivac, which was designed in collaboration with a major semiconductor IC producer. —Keibock Lee, Park Systems President
“SmartScan fully automatizes AFM imaging making it very easy for anyone to take an image of a sample at nanoscale resolution and clarity comparable to one taken by an expert,” comments Dr. Sang-il Park, CEO and founder of Park Systems.
New complete solution makes additive manufacturing standard for microfabrication
Digital issue now live
TOPTICA expands their portfolio of ultrafast fiber-basedlaser systems.
Hamamatsu Photonics introduces a new Photo IC diode, the S11154-201CT, with spectral response characteristics designed to closely match that of the human eye.
New McPherson CCD-UV Absorbance Spectrophotometer extends capabilities to deep ultraviolet and at faster time scales
Learning by doing…The power of practical science
IBA releases myQA®: New Global Quality Assurance Platform, The All-in-One, All Connected, and All Secure solution.
Connecting QA applications, people, and know-how through a Central Database and the Cloud.
(Toyohashi, Japan, 25 June 2014) Toyohashi Tech researchers have developed a simple, low-loss waveguide for Surface Plasmon Polaritons (SPPs) that is applicable to nanoscale photonic integrated circuits on silicon.
Visit us at conferences throughout 2015
Together with ETH-LBB and Cytosurge, Nanosurf is organizing the 4th FluidFM user meeting.
Oxford Instruments Asylum Research along with the Materials Research Society (MRS) will host a webinar titled “Beyond Topography: New Advances in AFM Characterization of Polymers” on May 28th, 2015 at 11:00 am ET.
We are extremely grateful for the support of the BVC whose contribution greatly aided in the success of our workshop.
CRAIC TimePro™ software is used with CRAIC Technologies microspectrometers to measure the kinetic UV-visible-NIR, Raman and fluorescence spectra of microscopic sample areas.
New Application Note Describes Nanomechanical Measurements on Diverse Materials Using the Asylum Research NanomechPro Toolkit
Oxford Instruments Asylum Research has released a new application note, “The NanomechPro™ Toolkit: Nanomechanical AFM Techniques for Diverse Materials,” written Dr. Donna Hurley, founder of Lark Scientific and former NIST project leader.
Staufen, 24.04.2015 ¦ The OWIS GmbH, headquartered in Staufen i. Br. in the southwest of Germany, celebrates this year its 35-year anniversary
On 3 December, the Japan Aerospace Exploration Agency (JAXA) funded Hayabusa 2 asteroid exploration mission launched on a six year mission to collect geological samples from the (162173) 1999 JU3 asteroid – an Apollo or “near earth” asteroid.
Interview from Oxford nanoSystems
Oxford Instruments Asylum Research Presents “Piezoresponse Force Microscopy: From Theory to Advanced Applications”
Two-part Webinar Series May 4 and May 6, 2015