Specialist equipment and materials for scientists working at the nanoscale. Includes material synthesis, analytical equipment, and applications.
B&W Tek, Inc., an advanced instrumentation company that delivers lab quality Raman spectroscopy solutions through user-friendly mobile platforms, is pleased to announce new enhancements to its NanoRam® handheld Raman spectrometer.
Trenton, New Jersey Princeton Instruments is pleased to announce the immediate availability of the ProEM®-HS line of high-speed EMCCD cameras with patented eXcelon®3 technology (X3) for low-light imaging and spectroscopy applications.
The PanScan-Freedom LT is an innovative new closed-cycle cryogen-free system for stable low temperature performance, unprecedented low drift, exceptional spectroscopy performance, and atomic resolution in a surprisingly compact, simple, and affordable package.
The 20/30 PV™ gives you the ability to collect UV-visible-NIR absorbance, reflectance, fluorescence and Raman spectra of microscopic sample areas. This is in addition to UV-visible-NIR imaging, film thickness measurements and micro-colorimetry.
Spectrometer specialist McPherson introduces a new high-resolution spectrometer system with Pico meter resolution capability.
USB3 Functionality with Day/Night Imaging
From Mechanical Engineering to Particle Accelerators: Hexapods and Their Fields of Application download
Today, many automation technology sectors require highly precise positioning systems. For multi-axis solutions, parallel-kinematic systems often are the perfect choice. Hexapods are a good example for this, where the travel ranges go from only a few to several hundred millimeters.
Piezo Linear Drives for Laser Technology: Automatic Mirror Positioning in Vacuum and in Inaccessible Place download
Lasers are versatile tools with a wide range of applications.
Park NX-Wafer for Wafer-Fab Manufacturing Fully Automates Semiconductor Industry’s Bare Wafer Automated Defect Review Process, Increases Throughput by 1,000 Percent
Park Systems, announces Park NX-Wafer, a revolutionary AFM design for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.
Small size and high resolution for 10-6 hPa: Miniature stage only 24 mm wide with a resolution of 0.5 nm
Physik Instrumente (PI) has now introduced vacuum-compatible versions of the LPS-24 series: Under vacuum conditions down to 10-6 hPa, the miniature stages of only 24 mm in width achieve a sub-nanometer resolution over a travel range of 15 mm.
(Toyohashi, Japan, 25 June 2014) Toyohashi Tech researchers have developed a simple, low-loss waveguide for Surface Plasmon Polaritons (SPPs) that is applicable to nanoscale photonic integrated circuits on silicon.
June 15 - 17, 2015, Paris - France
March 16 - 18, 2015, Dubai - UAE
MicroSense, LLC, a leader in non-contact wafer metrology systems, today announced multiple shipments of its new, next-generation automated sapphire wafer metrology tool, the MicroSense UltraMap C200.
Many international researchers joined the 11th Confocal Raman Imaging Symposium from September 29th to October 01st 2014 in Ulm, Germany.
Oxford Instruments Asylum Research Hosts a Webinar October 21st: “There’s No Other AFM Like Cypher™: Recent Technological Advances”
Oxford Instruments Asylum Research, the technology leader in Atomic Force Microscopy, will host a free webinar October 21st, “There’s No Other AFM Like Cypher: Recent Technological Advances.”
JPK report on the use of the NanoWizard® AFM system at TU Braunschweig to study the properties of DNA and DNA nanostructures
JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of their AFM system, the NanoWizard®, in the Nanobiosciences Group of the Institute of Physical & Theoretical Chemistry at the Technical University of Braunschweig.
Research article taken from IOP Publishing's journal, Nanotechnology
Measure Both Elastic and Viscous Properties with AFM Using Asylum Research’s Exclusive AM-FM Viscoelastic Mapping Mode
Oxford Instruments Asylum Research announces the availability of its powerful new nanomechanical imaging technique, AM-FM Viscoelastic Mapping Mode, for its entire line of Cypher™ and MFP-3D™ atomic force microscopes (AFMs).
The magnetic characterization of nanoscale materials is usually made by measuring a hysteresis loop. It is not possible to obtain interaction or coercivity distribution information from the hysteresis loop alone, however.
N-Series vacuum valves are available in both right angle and in-line formats in flanges sizes NW16 to NW50