Scanning probe microscopy

A branch of microscopy that images the surface of a sample using a physical probe that scans the specimen.

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Acknowledgement for investing into research weblink

Leybold Vacuum GmbH 14 Jun 2017

Inauguration of a Leybold Conference and Reception Room at Carnegie Mellon University Nanofabrication Facility.

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New Lake Shore eBook Discusses the FORC Measurement and Analysis Method weblink

Lake Shore Cryotronics, Inc. 16 May 2017

First-order-reversal-curve (FORC) measurements have become indispensable for characterizing interactions and coercivity distributions in a wide array of magnetic materials.

Lake shore thz probe arm

Lake Shore exhibiting THz measurement solutions at two European conferences

Lake Shore Cryotronics, Inc. 28 Sep 2016

THz characterization system, new cryogenic THz probe arm to be featured at IRMMW-THz and EuMW   

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Park Systems Introduces the Only AFM Capable of 300mm Wafer Scans for Defect Review and Failure Analysis in Semiconductor Manufacturing and Research

Park Systems 4 Aug 2016

The NX20 300mm, the only AFM on the market capable of scanning the entire sample area of 300mm wafers.

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SSP-354 Reactor

Nanotech Innovations 14 Jul 2016 | Updated: 3 Aug 2017

The versatile Nanotech Innovations SSP-354 provides a reliable source of carbon nanotubes for research projects and product development, while serving as a robust educational tool for academic labs.

New 8501 THz system

Lake Shore EMC conference exhibit to feature material characterization platforms

Lake Shore Cryotronics, Inc. 16 Jun 2016

Company spotlighting THz spectroscopic system for development-grade electronic material research

Gain entrance to the Raman world today – Stay flexible for emerging challenges tomorrow

LOT-QuantumDesign Ltd 16 May 2016

The new alpha300 access entry-level system from WITec

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