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Simulating charged-particle sources and beams

Webinar presented by Steve Malton.

Simulating charged-particle sources and beams

Simulation software lets designers characterize their devices simply and effectively. Coupled multiphysics simulations allow the study of beam charging and current flow in imperfect dielectrics and heating effects from both primary and secondary emission. Advanced interactions can be included in simulations, such as the ionization of a background gas to form plasma ion beams.

This webinar covers modelling of a wide range of devices and physics, from simple thermal electron emission to multispecies ionic plasmas.