Hiden Analytical Limited

+44 (0) 1925 445 225 http://www.HidenAnalytical.com

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Gas Analysis

For real time analysis of gases and vapours

QGAA compact bench-top system for real time gas and vapour analysis
HPR-20 R&DA specialist gas analysis system for advanced research
HPR-20 EGAA compact bench-top gas analysis system for evolved gas analysis in TGA-MS
HPR-20 TMSA specialist gas analysis system for fast event transient analysis
QIC BioStreamAn integrated mass spectrometer for multi-stream, multi reactor fermentation off-gas analysis
QIC MultiStreamAn integrated mass spectrometer and selector valve system for multi-component, multi-stream gas analysis
HPR-40 DSADesign

 

Plasma Characterisation

Plasma characterisation, plasma ion analysers and langmuir probes

EQPAnalysis of positive and negative ions, neutrals, and radicals
PSMPlasma sampling mass spectrometer
ESPionFor measurement of plasma properties
HPR-60 MBMSMolecular bea

 

SIMS Surface Analysis and SNMS Surface Analysis

For the determination of surface composition, contaminant analysis and depth profiling

SIMS WorkstationFor thin film depth profiling
EQSFor the analysis of secondary +ve and -ve ions from solid samples
MAXIMA system for static and dynamic SIMS and SNMS applications
IG5CA 5KeV Caesium ion gun for UHV surface analysis
IG20A 5KeV Argon or Oxygen ion source for UHV surface analysis
FIB-SIMS

 

FIB-SIMS for Nano-Scale Materials Analysis

Add high performance SIMS capability to your existing FIB system

FIB-SIMSAdd high performance SIMS capability to your existing FIB system
EQS

 

UHV Surface Science

For direct information on gas uptake and for dissolved output rates

EQSFor the analysis of secondary +ve and -ve ions from solid samples
SIMS WorkstationFor thin film depth profiling
EPICA system for UHV analysis of neutrals, radicals and ions
3F Series 1000 RGAFor high precision scientific and process applications
IDPA system for analysis of ions, neutrals and radicals in UHV desorption studies
TPD WorkstationFor UHV temperature programmed desorption studies

 

Catalysis

For the determination of surface composition, contaminant analysis and for depth profiling

CATLAB-PCSAutomated microreactor/mass spectrometer system
SpaciMSSpatially resolved capillary inlet mass spectrometer
HPR-20 R&DSpecialist gas analysis system for advanced research
HPR-20 EGAGas analysis system for evolved gas analysis in TGA-MS
HPR-20 TMSTransient mass spectrometer for fast event gas analysis
3F-PICTransient mass spectrometer for fast event UHV studies
HPR-60 MBMSMolecular beam sampling mass spectrometer for ion and radical analysis

 

Thin Films and Surface Engineering

Plasma characterisation, plasma ion analysers and langmuir probes

HPR-30Process and residual gas analysis
EQPAnalysis of positive and negative ions, neutrals, and radicals
PSMPlasma sampling mass spectrometer
ESPionFor measurement of plasma properties
TPD WorkstationFor UHV temperature programmed desorption studies
SIMS WorkstationFor thin film depth profiling
IMP-EPDFor ion etch control and optimum process quality
XBSMBE deposition flux rate monitor
IG5CA 5KeV Caesium ion gun for UHV surface analysis
IG20A 5KeV Argon or Oxygen ion source for UHV surface analysis
FIB-SIMSAdd high performance SIMS capability to your existing FIB system

 

Residual Gas Analysis for Vacuum Processing

For process monitoring and leak detection

HPR-30Process and residual gas analysis
HMTA dual mode RGA system for vacuum diagnostics and process monitoring
3F Series 1000 RGAFor high precision scientific and process applications

 

Thermal Analysis Mass Spectrometer Systems

For evolved gas analysis as a function of time and temperature

CATLAB-PCSAutomated microreactor/mass spectrometer system
TPD WorkstationFor UHV temperature programmed desorption studies
HPR-20 R&DSpecialist gas analysis system for advanced research
QGAA compact bench-top system for real time gas and vapour analysis

 

Nanotechnology

For the determination of surface composition, contaminant analysis and for depth profiling

SIMS WorkstationFor thin film depth profiling
XBSMBE deposition flux rate monitor
TPD WorkstationFor UHV temperature programmed desorption studies
HPR-60 MBMSA system for analysis of neutrals, radicals and ions
FIB-SIMSAdd high performance SIMS capability to your existing FIB system

Residual Gas Analysis

For routine, fast, wide dynamic range residual gas analysis

RGA SeriesSystems for the examination of components present in a vessel or evolved from a process
HMTA dual mode RGA system for vacuum diagnostics and process monitoring
3F Series 1000 RGAFor high precision scientific and process applications
HPR-30Process and residual gas analysis

Dissolved Species Analysis

For analysis of respiratory gases, hydrocarbons and sulphides

HPR-40 DSAMembrane inlet mass spectrometer for dissolved species analysis

Molecular Beam Studies

For molecular beam analysis

3F Series 1000 RGAFor high precision scientific and process applications
EPICA system for UHV analysis of neutrals, radicals and ions
HPR-60 MBMSMolecular beam sampling mass spectrometer for ion and radical analysis

Cluster Studies

Analysis of Clusters, Nanoscale Particles

EPICA system for UHV analysis of neutrals, radicals and ions
HPR-60 MBMSMolecular beam sampling mass spectrometer for ion and radical analysis

 

 

 

 

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