Bentham Instruments Limited

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Categories:Imaging

FSL300 Fibre Spectral Attenuation Spectrometer

The FSL300 system provides accurate assessment of fibre spectral loss, paramount in quality control processes, material research and optical fibre development.

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Employing the internationally recognised reference test method, the cut-back technique, the FSL300 provides high measurement precision across all fibre types. Due to the sequential nature of this technique, the FSL300 exhibits superlative optical and mechanical stability and repeatability at the cut-back end to ensure ultimate measurement confidence.

The FSL300 features a modular design, demonstrating enhanced configurational flexibility via the independent selection of chopped light source, monochromator configuration, lock-in amplifier, detector station and launch optics for measurement over an exceptionally wide spectral range.

Core benefits

Features

  • Accurately assesses fibre spectral loss
  • Employs internationally recognised cut-back technique
  • The wavelength band may be extended throughout UV-vis and into the IR beyond 5000nm
  • Fully-automated via PC, responsible for dB/km loss calculation as a function of wavelength 
  • High-precision assessment of a large range of fibre types, including silica, doped glass, plastic and photonic bandgap fibres
  • Optical stability is ensured by the use of a quart tungsten halogen light source driven by a constant-current power supply
  • Light source and launch optics are bolted firmly to the monochromator to negate mechanical instability over time

Reported Parameters

  • Fibre spectral attenuation, dB/km

Applications

  • IEC 60793-1-40:2001
  • Optical fibres - Part 1-40: Measurement methods and test procedures - Attenuation

 

Fibre Mounting

Launch opticBare fibre chuck for 80-200µm fibres
Detector stationV-groove bare fibre holder for 125 μm fibres

FSL300_Si

Spectral range350-1100nm
Typical spectral data interval5nm
Typical spectral bandwidth (FWHM)5nm
Light sourceOptically chopped IL1
MonochromatorTMc300 with 1200 g/mm gratings
Detector2.4x 2.4mm room temperature Silicon: 350-1100nm
Wavelength accuracyGA-T312R0U5 ± 0.2nm

FSL300_InGaAs

Spectral range800-1700nm
Typical spectral data interval5nm
Typical spectral bandwidth (FWHM)5nm
Light sourceOptically chopped IL1
MonochromatorTMc300 with 1200 g/mm gratings
Detector1mm dia. room temperature InGaAs: 800-1700nm
Wavelength accuracyGA-T30831U2: ± 0.3nm

FSL300_InGaAs_EX

Spectral range800-2500nm
Typical spectral data interval5nm
Typical spectral bandwidth (FWHM)5nm
Light sourceOptically chopped IL1
MonochromatorTMc300 with 830 & 600 g/mm gratings
Detector1mm dia. thermoelectrically cooled extended InGaAs: 800-2500nm
Wavelength accuracyGA-T30831U2: ± 0.3nm
GA-T306R1U6: ± 0.4nm

FSL300_PbSe

Spectral range1500-5000nm
Typical spectral data interval10nm
Typical spectral bandwidth (FWHM)10nm
Light sourceILD-QH-IR-CHOP
MonochromatorTMc300 with 600 & 300 g/mm gratings
Detector3mm dia. thermoelectrically cooled PbSe: 1000-5000nm
Wavelength accuracyGA-T306R1U6: ± 0.4nm
GA-T303R3U0: ± 0.8nm

 

FSL300_Dual_Si_InGaAs

Spectral range350-1700nm
Typical spectral data interval5nm
Typical spectral bandwidth (FWHM)5nm
Light sourceOptically chopped IL1
MonochromatorTMc300 with 1200 & 830 g/mm gratings
Detectors2.4x2.4mm room temperature Silicon: 350-1100nm
1mm dia. room temperature InGaAs: 800-1700nm
Wavelength accuracyGA-T312R0U5 ± 0.2nm
GA-T30831U2: ± 0.3nm

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