FLIR Systems

+32 (0) 3665 5100http://www.flir.com

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Ultra-Fast High Resolution Thermal Imaging

The FLIR X6900sc is an extraordinarily fast, highly sensitive MWIR camera designed for scientists, researchers, and engineers.

Capturing 640 x 512 images at 1000 frames per second, makes the FLIR X6900sc the world’s fastest full-resolution, commercially-available thermal camera. On-camera streaming and digital recording enables saving up to 26,000 frames of full resolution data to on-camera RAM with a guarantee of zero dropped frames. Whether measuring temperatures on fast moving objects or characterizing the thermal transient of objects as they heat up, the FLIR X6900sc offers the rapid frame speed, high resolution, and thermal sensitivity required to virtually stop motion enabling accurate temperature readings and recording of gradients across the entire frame.

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What’s new

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    Thermal Measurement Recording & Analysis Software

    Products | 21 Sep 2018

    FLIR Systems announces update version 4.40 of its popular thermal measurement, recording and analysis software - ResearchIR.

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    FLIR Systems Introduce Hyperspectral Imaging

    News | 14 Sep 2018

    FLIR Systems has teamed up with imaging specialists - Bodkin Design & Engineering LLC (BD&E) to provide a hyperspectral imaging solution that allows you to collect any waveband of spectral and spatial information in one high-speed video frame.

  • Guide to Radiological Detector Selection

    New Guidebook to Radiological Detector Selection

    News | 7 Sep 2018

    FLIR Systems has published a new guidebook, which provides helpful tips for people involved with radiological detection, identification and monitoring who are looking for expert advice to help them evaluate and purchase the right tool for a deployment program.

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    Non-Destructive Testing of Advanced Materials

    News | 28 Aug 2018

     The FLIR A6750sc SLS thermal imaging camera range from FLIR Systems comes standard with Lock-In, Transient, and Pulse capabilities enabling you to undertake meticulous Non-Destructive Testing (NDT) or stress mapping, resolving temperature differences as low as 1 mK.

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    Making Electronics Design Faster & Easier

    News | 17 Aug 2018

    FLIR Systems has published a customer testimonial video* from Highland Technology Inc.

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