Park Systems is the Atomic Force Microscope(AFM) technology leader, providing products that address the requirements of all research and industrial nanoscale applications. All systems are fully compatible with innovative and powerful options.
The product line of Park Systems reflects our focused strength in nanometrology applications. The company's comprehensive portfolio of products, software, services, and expertise is designed and engineered to help customers achieve the metrology performance that meets the needs and requirements of present and future applications.
In a nanoscale measurement, a repeatable, reproducible, and reliable measurement is just as important as nanoscale resolution. The innovative metrology platform of the XE-AFM ushered a new era of nanometrology that overcomes non-linearity and non-orthogonality associated with conventional piezoelectric tube based AFM. The XE-AFM is a disruptive market force that has far reaching consequences, in that it expands the application of nanometrology beyond what has been previously made possible with conventional AFM technology.
Park Systems introduces QuickStep SCM, the newest technology for high throughput in scanning capacitance microscopy (SCM). Designed to work with Park NX AFM series, Park’s QuickStep SCM provides accurate dopant profiles of semiconductor device structures, 5 to 10 times faster than any other competing SCM atomic force microscopy systems.
Atomic Force Microscopy Image Contest announced by Park Systems. Winners to Receive Prizes and Appear in the Park Systems 2014 Calendar
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announced today their first AFM image contest beginning Aug 26-Nov 1, 2013 for scientists, engineers, researchers and others who work with AFM.
Park Systems Announces PinPoint Conductive AFM for High Accuracy and Precision Conductive Atomic Force Microscopy (AFM)
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolutionfor failure analysis (FA) in the semiconductor industry.
Fully Automated Automatic Defect Review and Sub-Angstrom Surface Roughness for Hard Disk Media and Semiconductor Substrates
Park Systems: NX10The NX10 is the world’s premium research-grade True Non-Contact AFM, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift.