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  • RHK Technology

    RHK Ships 100th R9 Control System weblink

    RHK Technology

    Products | 8 April 2014

    RHK Technology, Inc. announced shipment of its 100th R9 Control System for Scanning Probe Microscopes. The latest in RHK’s long history of advances, R9 breaks new ground with its revolutionary design: a totally...

  • Park Systems Introduces Automatic Defect Review for Semiconductor Wafers

    Park Systems Introduces Automatic Defect Review for Semiconductor Wafers - An Astounding 1,000% Throughput Increase

    Park Systems

    Products | 3 April 2014

    Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, proudly introduces the Automatic Defect Review...

  • Nanosurf AG FlexAFM

    Nanosurf FlexAFM weblink

    Nanosurf AG

    Products | 28 March 2014

    Nanosurf FlexAFM atomic force microscope. Your Versatile Research AFM for Materials & Life Science. For success in research, scientists depend on professional tools that can best provide the information needed, regardless of the...

  • Nanosurf AG FluidFM

    Nanosurf FluidFM videoweblink

    Nanosurf AG

    Products | 28 March 2014

    A unique new tool for single cell biology and beyond. Video: Example of single-cell force spectroscopy using FluidFM Fluid Force Microscopy combines the unique possibilities of nanofluidics by Cytosurge with the positional accuracy...

  • Bruker Dimension FastScanTM Atomic Force Microscope

    Dimension FastScanTM Atomic Force Microscope weblink

    Bruker Nano Surfaces

    Products | 6 March 2014

    The Dimension FastScanTM  Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing legendary Dimension© Icon© resolution and performance. This breakthrough...

  • Namuna Panday, Park Systems 2014 AFM Photo Contest Winner

    Park Systems 2014 Announces Atomic Force Microscopy Image Contest Winner

    Park Systems

    News | 5 March 2014

    Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International...

  • Park PinPoint Conductive AFM on SRAM

    Park Systems New Atomic Force Microscope Technology Surpasses Old Standards for Semiconductor Failure Analysis Detection Ensuring Accuracy and Lowering Costs

    Park Systems

    Products | 5 March 2014

    Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997...

  • Oxford Instruments webinar - Taking nano to the next level

    Taking nano to the next level

    Oxford Instruments Plasma Technology

    Webinars | 18 February 2014

    Webinar presented by Deirdre Olynick (Lawrence Berkeley National Laboratory) and Kim Lee (Seagate) Taking nano to the next level Focusing on recent advances in nanoscale etching and in atomic layer deposition (ALD) from...

  • N-470 PiezoMike Linear Actuator

    N-470 PiezoMike Linear Actuator

    Physik Instrumente (PI) GmbH & Co. KG

    Products | 18 February 2014

    Minimum Dimensions, High Forces, Stable Positioning. Holding force >100 N Step size 20 nm Travel range 7.4 mm to 26 mm Compact design Feed force 22 N Lifetime >1.000.000.000 steps Mounting thread or shank...

  • Atomic Force Microscope ezAFM

    Atomic Force Microscope – ezAFM videoweblink

    Hall Scientific Ltd

    Products | 7 January 2014

    The Atomic Force Microscope (ezAFM) by Nanomagnetics is now available from HSL It features excellent performance while being remarkably affordable. The Atomic Force Microscope (ezAFM) by Nanomagnetics is now...

  • Park Systems Unveils New Park XE15

    Park Systems Unveils New Park XE15 weblink

    Park Systems

    Products | 6 January 2014

    Powerfully Versatile Atomic Force Microscope with Unique MultiSample™ Scan Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the debut of Park XE15, a powerfully versatile...

  • RHK Technology

    Helium-Free SPM 15 - 400 K download

    RHK Technology

    Products | 6 December 2013

    Closed-Cycle Cryostat Atomic Resolution 1 Only from RHK Helium-Free SPM 15 - 400 K Closed-Cycle Cryostat Atomic Resolution New 2 RHK PanScan images during CCCryo operation G. Nazin Group (Univ. of OR) Initial test:...

  • New OWIS® catalogue available

    OWIS GmbH

    News | 4 December 2013

    The new OWIS ® catalogue is available since the fourth quarter of 2013. On over 700 pages, more than 1,400 quality products in the field of optical beam handling and positioning systems are presented. With numerous...

  • Park Systems QuickStep SCM

    Park Systems Introduces QuickStep SCM New High Speed Scanning Capacitance Microscopy weblink

    Park Systems

    Products | 29 November 2013

    Park Systems introduces QuickStep SCM, the newest technology for high throughput in scanning capacitance microscopy (SCM). Designed to work with Park NX AFM series,...

  • Sarfus Mapping Station from Nanolane

    Sarfus Mapping Station from Nanolane weblink

    NANOLANE

    Products | 25 November 2013

    Nanolane offers its new generation of Sarfus Mapping stations, label-free analytical instruments for real-time sample characterization at nanoscale (down to 0.1nm or 1ng/cm²). Based on the unique SEEC (Surface...

  • Nanosurf NaioAFM

    Nanosurf NaioAFM weblink

    Nanosurf AG

    Products | 31 October 2013

    Your All-in-One AFM for Nanoeducation and Small Samples. The NaioAFM is the ideal atomic force microscope for nanoeducation and small sample measurements. This all-in-one AFM system provides solid performance and easy handling, with...

  • Electronic contacts with a single molecule

    Electronic contacts with a single molecule

    Oxford Instruments NanoScience

    News | 23 October 2013

    Webinar presented by Dr Christian Joachim.  Electronic contacts with a single molecule In this webinar Dr Christian Joachim will present different approaches to passing a permanent electronic current...

  • Charles Marcus

    Triton: advances in dilution refrigerator technology for quantum info processing

    Oxford Instruments NanoScience

    Webinars | 2 October 2013

    Webinar presented by Prof Charles Marcus Triton: advances in dilution refrigerator technology for quantum info processing In this webinar Prof. Charles Marcus presents...

  • PinPoint Conductive AFM for High Accuracy and Precision Conductive AFM

    Park Systems Announces PinPoint Conductive AFM for High Accuracy and Precision Conductive Atomic Force Microscopy (AFM)

    Park Systems

    Products | 2 October 2013

    Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an...

  • CRAIC Technologies, Inc.

    Watch the new CRAIC Technologies, Inc. video here video

    CRAIC Technologies, Inc.

    Videos | 26 September 2013

    CRAIC Technologies is a global technology leader focused microscopy, microimaging and microspectroscopy in the UV, visible and near-infrared regions. Sub-micron areas can be measured by absorbance,...

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