Introducing the leading solution for correlative AFM-SEM-EDX analysis

March 15, 2017 (10:00 CET and 18:00 CET)

Afsem image fly quanta subtle intro

The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM™enables you to easily combine three of the most powerful analysis techniques available — AFM, SEM, and EDX — to greatly extend your correlative microscopy and analysis possibilities.

Join us for an exciting Nanosurf and GETec webinar to explore the recent advances in correlative AFM-SEM-EDX analysis and learn how to combine these techniques in an interactive experiment.

Topics will include:

  • Introduction and overview of the AFSEM™ system
  • Compatibility to existing SEMs and additional add-ons
    (e.g. tensile stages or nanoindenters)
  • Recent application advances
    (e.g. in-situ roughness and conductivity analysis, correlative SEM/EDX/AFM, 3D tomography)

Combined sem edx afm topography conductivity

Experts will be online to answer your specific AFSEM™ application and instrumentation questions after the conclusion of the webinar.

Please register for the webinar at After registering, you will receive a confirmation e-mail containing information about joining the webinar.

Click here for further information

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