The Dimension FastScanTM Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing legendary Dimension© Icon© resolution and performance.
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University.
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution for failure analysis (FA) in the semiconductor industry.
Cianna Medical, Inc., a women’s health company, today announced favorably low recurrence rates – even for younger women – as part of a retrospective analysis of 673 patients with invasive breast cancer treated with the SAVI® breast brachytherapy applicator.
Helping hospitals get to grips with new European legislation on dose.
iCAD to Host Breast IORT Symposium and to Showcase Xoft System at 31st Annual Miami Breast Cancer Conference, Booth #22.
VISIUS iCT listing expands availability of state-of-the-art imaging with low dose management accessed effortlessly in the OR.
ThermoDox Demonstrates Impressive Response Rate in Refractory Patients.
Public mammography screening provider in Finland mobilizes against osteoporosis.
The Hiden SIMS Workstation is a stand-alone, general purpose, UHV SIMS/SNMS analysis system based around the MAXIM analyser. The instrument is both powerful and easy to use with a self-tuning secondary ion column and software controlled ion guns.
For 30 years Hiden Analytical has been a global leader in the design and manufacture of scientific instruments for research, development and production applications.See all videos
This white paper will present an overview of the focusing properties of magnetic quadrupoles and show how beam spot size can be determined using arc segment emitters.
Through scripting, the clinic specific procedures can be implemented and automated. Scripting in RayStation provides automation, connectivity and flexibility beyond what is possible in the ordinary graphical user interface.
RHK Technology is the leading supplier of Flexible, High Performance SPM products designed specifically for researchers.
RHK designs and manufactures a full line of world-class Ultra High Vacuum Scanning Probe Microscopes (UHV SPM) instruments and Control Systems to continually advance surface science and nanotechnology R&D. Our UHV SPM instruments and Controllers are carefully engineered to provide atomic-scale imaging, interaction, and analysis, and to perform atomic manipulation and nanofabrication. RHK products are installed at top University and National Research Laboratories around the world. New R&D ideas and products flow from customers pushing the limits of equipment, and from RHK’s Technical Advisory Board of top scientists world-wide.Learn more about this supplier