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High-Accuracy and Traceable AFM Measurements on Semiconductors and Step Standards:

Physik Instrumente (PI) GmbH & Co. KG 31 Jul 2015

Positioning in Sub-Nanometer Resolution

251 mx

New diffraction grating improves efficiency and range in the soft x-ray and extreme ultraviolet

McPherson 31 Jul 2015

The new grating extends the efficient range of the McPherson Model 251MX for more sensitive spectral acquisition. With a digital camera and adjustable slits it now works from 1 to 100 nanometers (10 to 1500 eV).

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New GetStarted Feature on Asylum Research AFMs Makes Imaging Easier and More Productive While Maintaining All the Benefits of Tapping Mode

Oxford Instruments Asylum Research, Inc. 30 Jul 2015

Researchers sometimes struggle to get good images using atomic force microscopy (AFM) because of the complexity of optimizing imaging parameters. The new GetStarted™ feature on Oxford Instruments Asylum Research AFMs eliminates this challenge, making AFM operation much simpler and more productive.

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1

High-Accuracy and Traceable AFM Measurements on Semiconductors and Step Standards:

Physik Instrumente (PI) GmbH & Co. KG 31 Jul 2015

Positioning in Sub-Nanometer Resolution

Mcpherson red oval

Gas Purging Keeps UV Systems Healthy download

McPherson 31 Jul 2015

New White Paper from McPherson

251 mx

New diffraction grating improves efficiency and range in the soft x-ray and extreme ultraviolet

McPherson 31 Jul 2015

The new grating extends the efficient range of the McPherson Model 251MX for more sensitive spectral acquisition. With a digital camera and adjustable slits it now works from 1 to 100 nanometers (10 to 1500 eV).

Hiden cat

New Gas Analysis Catalogue from Hiden

Hiden Analytical Limited 31 Jul 2015

With over 30 years’ experience in the field, Hiden Analytical remains dedicated to producing mass spectrometer-based gas analysis systems.

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New GetStarted Feature on Asylum Research AFMs Makes Imaging Easier and More Productive While Maintaining All the Benefits of Tapping Mode

Oxford Instruments Asylum Research, Inc. 30 Jul 2015

Researchers sometimes struggle to get good images using atomic force microscopy (AFM) because of the complexity of optimizing imaging parameters. The new GetStarted™ feature on Oxford Instruments Asylum Research AFMs eliminates this challenge, making AFM operation much simpler and more productive.

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 Featured video

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Watch the Janis video here

Janis Research Cryogenic Applications

A brief overview of Janis Research products. Our sales engineers will work with you to find the best cryogenic research equipment for your application and budget requirements.

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Evaluating Electrically Insulating Epoxies

Master Bond Inc. 22 Jun 2015

New White Paper from Master Bond

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New White Paper from RaySearch Laboratories download weblink

RaySearch Laboratories AB 9 Jun 2015

Robust Optimization in Raystation

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Featured supplier

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Tessella

Tessella is an international analytics, software services and consulting company

We are known for finding and delivering innovative answers to the complex business and technical challenges of some of the world’s most forward-thinking organizations. We are innovative problem solvers, passionate about science and technology, committed to excellence, and to our clients’ success.

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