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Categories:Imaging

Correlative 3D Raman Imaging: Advancing Semiconductors & Energy Storage Devices

Webinar presented by Dr Thomas Dieing: Director, Applications and Support

Correlative 3D Raman Imaging: Advancing Semiconductors & Energy Storage Devices

15th November 2016 4pm CET

FREE TO REGISTER

This webinar aims to highlight the benefits of correlative Raman imaging for the analysis of chemical composition, crystallinity, stress and optoelectronic properties of materials such as semiconductors, 2D materials and electrodes. Used in combination with either atomic force microscopy or scanning electron microscopy, Raman correlative microscopy provides deep insight into the relation between molecular and structural features of materials – even in 3D.
The principles of state-of-the-art confocal Raman imaging will first be introduced, then its power as an ideal tool for investigating the chemical and molecular characteristics of a sample will be demonstrated with examples of 2D materials, semiconductors and battery electrodes. The webinar will describe clearly the advantages and ease- of- use offered by Raman imaging systems integrated with other microscopy technologies.

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