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RISE -The Complete Picture of Material Properties: Correlative Raman-SEM Imaging

Webinar presented by Dr. Ute Schmidt – Applications Manager at WITec GmbH

RISE -The Complete Picture of Material Properties: Correlative Raman-SEM Imaging

14th November 2017 4pm GMT

FREE TO REGISTER

RISE - Raman Imaging and Scanning Electron - microscopy is a correlative approach that combines molecular and ultrastructural analysis. With this hybrid technique, information on the chemical composition of a sample provided by the optical Raman microscope is overlaid onto structural features imaged with a high resolution scanning electron microscope. Both methods can be controlled with software and the correlation carried out while the sample remains under vacuum. The integration of both techniques within a single instrument eliminates the necessity of manually locating the same measurement position, a notoriously time-consuming process with separate instruments.
In this webinar, the principles of state-of-the-art confocal Raman imaging as a tool for the analysis of molecular characteristics of a sample will be presented, then the manner in which this information can be linked to structural information acquired with scanning electron microscopy will be demonstrated. The advantages of seamless correlative investigation will be described and shown with several examples.