Your All-in-One AFM for Nanoeducation and Small Samples.
The NaioAFM is the ideal atomic force microscope for nanoeducation and small sample measurements. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
Discover the highly compact, user-friendly, and affordable NaioAFM system yourself and ask for an on-site demo!
- Integrated controller, airflow shielding, vibration isolation, and XY-table (12 mm)
- High resolution top view camera and side view sample observation built in
- Feature-complete: All standard operating modes available
- Simple cantilever exchange: no laser or detector adjustment required
- No system setup needed: just plug into your PC and start the software
- User-friendly software wizards quickly prepare measurement parameters
- A low-cost AFM solution for any budget!
For more details, download the NaioAFM brochure.
For a detailed quote, please fill out our quote request form.