Park Systems is the Atomic Force Microscope(AFM) technology leader, providing products that address the requirements of all research and industrial nanoscale applications. All systems are fully compatible with innovative and powerful options.
The product line of Park Systems reflects our focused strength in nanometrology applications. The company's comprehensive portfolio of products, software, services, and expertise is designed and engineered to help customers achieve the metrology performance that meets the needs and requirements of present and future applications.
In a nanoscale measurement, a repeatable, reproducible, and reliable measurement is just as important as nanoscale resolution. The innovative metrology platform of the XE-AFM ushered a new era of nanometrology that overcomes non-linearity and non-orthogonality associated with conventional piezoelectric tube based AFM. The XE-AFM is a disruptive market force that has far reaching consequences, in that it expands the application of nanometrology beyond what has been previously made possible with conventional AFM technology.
What’s new
Park Systems, World-Leader in Atomic Force Microscopes Invites Semicon West Attendees and Customers to Annual Semicon West AFM Luncheon
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 is hosting a free AFM Luncheon at the link: http://www.parkafm.com/luncheon for all SEMICON West attendees and Park customers on July 11, 2017 from 12-2pm at the Thirsty Bear Brewing Company.
Park Systems, World Leader Manufacturer of Atomic Force Microscopes Announces Opening of European Headquarters in Heidelberg, Germany
Park Systems, world-leader in atomic force microscopy (AFM) recently announced the opening of their European Headquarters in Heidelberg, Germany and appointment of Ludger Weisser as General Manager.
Park Systems, World Leading Supplier of Atomic Force Microscopes, Invites All Researchers to Become Park AFM Scholars and Receive a Nanotechnology Research Scholarship
Park Systems announces the 2017 Park AFM Scholarship Award eligible to undergraduate or postdoctoral students working in nanotechnology research either already using Park AFM or who have research they would like to do with Atomic Force Microscope and need help getting access to the equipment.
Park Systems Introduces the Only AFM Capable of 300mm Wafer Scans for Defect Review and Failure Analysis in Semiconductor Manufacturing and Research
The NX20 300mm, the only AFM on the market capable of scanning the entire sample area of 300mm wafers.
Park Systems, World Leading Manufacturer of Atomic Force Microscopes Receives Frost & Sullivan 2016 Global Enabling Technology Leadership Award
Frost & Sullivan announced today that Park Systems, the leading manufacturer of Atomic Force Microscopes is the recipient of its 2016 Global Enabling Technology Leadership Award.